Программа выступлений
Saturday, September 15
Registration (School-Conference) 13:00 – 15:00
Opening remarks 15:00 – 15:15
Chair: Bushuev V.A., Goray L.I. 15:15 – 16:15
Tutorial Lecture 1
Lec-1 High Resolution X-ray Scattering: A General Probe for Very Different Length Scales (invited)
Brian Keith Tanner
Durham University, United Kingdom
Coffee break 16:15 – 16:30
Tutorial Lecture 2 16:30 – 17:30
Lec-2 Reflectivity and Off-Specular Grazing Incidence Scattering from Surfaces: Theory and Applications (invited)
Sunil Kumar Sinha
University of California, San Diego, USA
Coffee break 17:30 – 17:45
Tutorial Lecture 3 17:45 – 18:45
Lec-3 High-resolution x-ray diffractometry (invited)
Vaclav Holy
Charles University in Prague, Czech Republic
Boat trip & Refreshment 19:00 – 23:00
Sunday, September 16
Registration 08:30 – 18:00
Chair: Zolotoyabko E.., Voloshin A. 09:30 – 10:30
Tutorial Lecture 4
Lec-4 Phase contrast imaging with synchrotron radiation (invited)
Jose Baruchel
European Synchrotron Radiation Facility, France
Coffee break 10:30 – 10:45
Tutorial Lecture 5 10:45 – 11:45
Lec-5 X-ray diffraction topography – an evolving tool (invited)
Juergen Walter Haertwig
European Synchrotron Radiation Facility, France
Tutorial Lecture 6 11:45 – 12:45
Lec-6 Hard X-ray optics for Synchrotron Radiation Beamlines (invited)
Raymond Barrett
European Synchrotron Radiation Facility, France
Lunch (School-Conference) 12:45 – 14:00
Opening ceremony 14:00 – 14:45
Chair: Kyutt R.N, Kovalchuk M.V.
14:15 – 14:45
X-ray diffraction – from the Past to the Future
Kovalchuk M.V.
Kurchatov Institute, Shubnikov Institute of Crystallography
Chair: Shulpina I.L., Haertwig J.W. 14:45 – 16:00
Session 1: X-ray topography
14:45-15:00
Three-dimensional rocking curve imaging (3D-RCI) to measure the effective distortion in the neighbourhood of a defect within a crystal: the example of ice
O1-01 Philip A., Meyssonnier J., Kluender R.T. and Baruchel J.
LGGE, UJF-CNRS UMR 5183, St. Martin d’Hères, France; European Synchrotron Radiation Facility, Grenoble, France
15:00-15:15
X-ray Diffraction Imaging for Prediction of the Propagation Probability of Individual Cracks in Brittle Single Crystal Materials
O1-02 Tanner B.K., Danilewsky A.N., Wittge J., Garagorri J., Elizalde M.R., Allen D., McNally P., Fossati M.C. and Jacques D.
Dept. of Physics, Durham University, UK; Kristallographie, Institut für Geowissenschaften, Universität Freiburg, Germany; CEIT and Tecnun (University of Navarra) San Sebastian, Spain; School of Electronic Engineering, Dublin City University, Ireland; Jordan Valley Semiconductors Ltd, Durham, UK
15:15-15:30
Cleavage, Microcrack Formation and Fracture in Silicon: In-situ X-ray Diffraction Imaging at High Temperature
O1-03 Danilewsky A.N., Wittge J., Ehlers Ch., Jauss T., Kiefl K., Croll A., Allen D. McNally P., Garagorri J., Elizalde M.R., Fossati M.C. and Tanner B.K.
Kristallographie, Institut für Geowissenschaften, Universität Freiburg, Germany; School of Electronic Engineering, Dublin City University, Ireland; CEIT and Tecnun (University of Navarra) San Sebastian, Spain; Dept. of Physics, Durham University, UK
Diffraction laminography applied to 3-dimensional imaging of dislocation networks in silicon wafers
Haenschke, D., Helfen, L., Altapova, V., Moosmann, J., Hamann, E., Wittge, J., Danilewsky, A.N., Baumbach, T.
Karlsruhe Institute of Technology, Germany; Institute for Synchrotron Radiation ANKA, Germany; University Freiburg, Germany
Coffee break 16:00 – 16:15
Chair: Podurets K.M. 16:15 – 17:00
Session 2: Fast tomography
16:15-16:30
O2-01 X-ray microtomography in the study of organic and inorganic materials
Asadchikov V.E. ,Yakimchuk I.V., Buzmkov A.V., Zolotov D.A.
Shubnikov Institute of Crystallography RAS, Moscow, Russia; Lomonosov Moscow State University, Moscow, Russia
16:30-16:45
O2-02 Development of microtomographic in vivo imaging to study lung dynamics at the micrometer scale
Lovric G., Mokso R., Schittny J.C., Roth-Kleiner M., Stampanoni M.
Swiss Light Source, Paul Scherrer Institute, Switzerland; Institute for Biomedical Engineering, ETH Zurich, Switzerland; Institute of Anatomy, University of Bern, Switzerland; Centre Hospitalier Universitaire Vaudois, University of Lausanne, Switzerland
16:45-17:00
O2-03 Effective Regularized Algebraic Reconstruction Technique for Computed Tomography
Prun V.E., Nikolaev D.P., Chukalina M.V., Buzmakov A.V., Asadchikov V.E.
Moscow Institute of Physics and Technology, Russia; Institute for Information Transmission Problems (Kharkevich Institute) RAS, Moscow, Russia; Institute of Microelectronics Technology and High Purity Materials RAS, Chernogolovka, Russia; Shubnikov Institute of Crystallography RAS, Moscow, Russia
